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KIPiS News & Events
04/29/2010 | 4423
May 10, 2010 - May 12, 2010
This prestigious event is an opportunity for international leaders in EW at all levels from across the armed forces, government, industry, technology and academia, to meet to shape the future of EW and share their experiences. It will draw on current operational experience. Leading industry partners will demonstrate the latest technology and the benefits of innovative capability management. The conference will cover all operational environments and capability development.
04/14/2010 | 3423
The HKTDC Hong Kong Electronics Fair (Spring Edition), HKTDC International ICT Expo and HKTDC Hong Kong International Lighting Fair (Spring Edition) opened on 13 April 2010 with an emphasis on environmental solutions and cutting-edge products, including 3D technology. The shows continue through 16 April.
04/03/2010 | 2364
The staff of Test & Measurement World announced the winners of annual Best in Test and Test of Time awards, which honor important and innovative products and services in the electronics test, measurement, and inspection industry.
03/29/2010 | 4270
Oscilloscopes are commonly used to observe the wave shape of a signal, measure the amplitude or frequency of a signal, measure the time between two events, observe noise on a signal, and many other measurements. This webinar will introduce basic oscilloscope controls and key specifications that need to be understood when measuring and analysing signals.
03/25/2010 | 3355
The International Telecommunication Union (ITU) approved a mobile phone charger made by South Korean companies as one of the global standards.
03/24/2010 | 3298
For reasons of safety and reliability, the importance of being able to trace products throughout the supply chain has strongly increased in recent years. The new ISO 17367:2009 standard will help manufacturers and distributors to track products and to manage their traceability thanks to standardized RF tags.
03/22/2010 | 3478
The seminar will take place on Thursday, March 25, 2010. This seminar is a follow-up to the material presented in the “Semiconductor C-V Testing Fundamentals” seminar. It is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. Two broadcast times: 15:00 CET (Europe) and 2:00 PM EDT (North America).
03/18/2010 | 2698
Messe München International and the Shanghai Applied R&D Public Service Platform for Solid State Lighting (LED) have formalized a partnership aimed at supporting the Chinese LED sector and facilitating international cooperation. The partners organized a special LED zone as well as the 4th Shanghai Innovation and Application Forum on LED Solid State Lighting held at “Eelectronica & Productronica China 2010”.
03/01/2010 | 5014
National Instruments and Tektronix Inc. announced open registration for the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar, a free half-day technical event that helps engineers increase efficiency in their embedded system design processes. Held from March 2 through May 18 in 11 cities, the seminar focuses on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabVIEW graphical system design software can significantly enhance design efficiency and accuracy.
02/26/2010 | 2733
Last year was a strong one for innovation and EDN even added a few new categories this time to accommodate the high number of quality nominations. You can now pick the winners of EDN's 20th annual program honoring engineering excellence. On-line voting will run until March 19.
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