RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

Free Keithley Web-Based Seminar to reveal Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing

Free Keithley Web-Based Seminar to reveal Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing

03/22/2010

Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, offers a free, web-based seminar titled "Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing".


Two broadcast times


This seminar is a follow-up to the material presented in the “Semiconductor C-V Testing Fundamentals” seminar. It is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar will discuss the keys to getting good C-V measurement results. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.

Those participating in this seminar will learn:

  • How to properly connect a C-V instrument to a probe station 
  • Common cable correction techniques 
  • Performance verification at the probe tips 
  • How to identify and troubleshoot typical C-V errors 
  • How to implement extended C-V applications, such as high voltage and quasistatic C-V

Target Audience

This seminar is intended for those whose job requires performing C-V measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations will also benefit from this seminar.


Speaker: Lee Stauffer, Senior Staff Technologist

Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor labs.

We recommend adding Keithley Instruments, Inc. and ON24 to your e-mail client's safe-sender list.


Registration Information.

“Tips, Tricks, and Traps of Semiconductor Capacitance-Voltage (C-V) Testing” is free to the public. To view the presentation, visit www.keithley.com/events/semconfs/webseminars.

For more information on Keithley or any of its test solutions, visit www.keithley.com



Back to the list


Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search