T&MW announces 2010 award winners

04/03/2010

The staff of Test & Measurement World announced the winners of annual Best in Test and Test of Time awards, which honor important and innovative products and services in the electronics test, measurement, and inspection industry.

The 2010 Best in Test winner in each of the 17 product categories is listed below.

The Best in Test winner that received the most overall votes will be named the Test Product of the Year for 2010. The winner will be announced on www.tmworld.com on April 7. You can also read about the winning product in Test & Measurement World May 2010 issue.

For the annual Test of Time award, which honors a product that continues to provide state-of-the-art service five or more years after its introduction, were named seven finalists. Test & Measurement World readers voted Agilent Technologies’ 89600 Vector Signal Analysis Software as the recipient of the 2010 award.

For more information about the Test & Measurement World awards program and to read about all of the finalists and winners, see www.tmworld.com/awards.

2010 Best in Test Award Winners

• Audio/video and multimedia: MMTS Moving Video Test System, VI Technology
• Bit-error-rate testers: J-BERT, Agilent Technologies
• Board and system test: URT 5.0 Universal Receiver Tester, Averna
• Communications network test: T-BERD/MTS-4000 Multiple Services Test Platform, JDSU
• Computer bus analyzers: PCIe Jammer Error-Injection Tool, Agilent Technologies
• Data acquisition: NI X Series Devices for PCI Express and PXI Express, National Instruments
• DFT, boundary scan, and emulation: JULIET Desktop JTAG Tester, GOEPEL Electronic
• EMC and safety test: NSG 3040 EMC Multifunction Generator, Teseq
• Fiber optics: N4391A Optical Modulation Analyzer, Agilent Technologies
• General-purpose instruments (non-oscilloscopes): EX1200 Series Switch/Measure System, VTI Instruments
• Machine vision and inspection: BOA Vision System, DALSA
• Oscilloscopes: MSO70000, Tektronix
• RF/microwave instruments (general purpose): N9030A PXA Signal Analyzer, Agilent Technologies
• Semiconductor test: ETS-88 Multisite Test System, Teradyne
• Test components and subsystems: EX72SF Microwave Switching Subsystem, VTI Instruments
• Test-development and analysis software: Proligent Analytics, Averna
• Wireless test (standard specific): ACE MX MIMO Channel Emulator, Azimuth Systems

www.tmworld.com