National Instruments and Tektronix Announce Embedded Design Seminar

03/01/2010

National Instruments and Tektronix Inc. announced open registration for the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar, a free half-day technical event that helps engineers increase efficiency in their embedded system design processes. Held from March 2 through May 18 in 11 cities, the seminar focuses on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabVIEW graphical system design software can significantly enhance design efficiency and accuracy.

"Tektronix and National Instruments have collaborated for many years to make design engineers' jobs easier," said Martyn Etherington, vice president of worldwide marketing at Tektronix. "We have worked hard to give engineers seamless integration between Tektronix oscilloscopes and LabVIEW to meet the advanced measurement and analysis requirements of embedded system designers. Now we’re coming together once again to show engineers just how effective our products are at dramatically increasing efficiency in the design lab."

The event features sessions from Tektronix and National Instruments that equip attendees with the knowledge and tools to speed their product design life cycles through effective debugging and verification. Attendees can gain insight from experts from both companies on how to efficiently test and verify their designs through precise serial bus decode measurements, instrument control, timing and power analysis  and report generation. Additionally, engineers can learn best practices for scaling development efforts from design to test with hybrid test systems.

"This seminar will show engineers how they can simplify their work and significantly reduce product development cycles," said John Pasquarette, vice president of product marketing for software at National Instruments. "By integrating Tektronix instrumentation with LabVIEW and PXI for instrument control and test automation, design engineers can more quickly and easily analyze and visualize their data."

The seminar includes three sessions in which measurement experts from Tektronix and National Instruments explore in detail techniques for achieving efficiency gains. The presenters discuss the following concepts:

• Streamlined methods for acquiring measurements in USB, SPI and I2C protocols
• Running power efficiency and other custom analyses to convert data into useful information
• Visualization of data and generating consistent reports 
• Connecting multiple instruments on the design bench to a host computer or laptop over GPIB, USB, PXI and Ethernet/LXI for optimized instrument control 

In addition, representatives from Tektronix and NI will be on hand to answer specific questions.

The seminar will take place in the following cities on the corresponding dates:

• Austin, March 2, 2010
• Dallas, March 4, 2010
• San Diego, March 23, 2010
• Santa Clara, March 25, 2010
• Toronto, April 13, 2010
• Washington DC, April 20, 2010
• Newark, April 27, 2010
• Boston, April 29, 2010
• Orlando, May 11, 2010
• Phoenix, May 13, 2010
• Portland, May 18, 2010

Readers can register for this free seminar and review the full agenda by visiting www.nitekseminar.com

National Instruments (www.ni.com)

Tektronix (www.tektronix.com)