KIPiS articles

Author(s):  Schulz, Bernhard , Schulze, Guido
Issue:  KIPiS 2014 #3
The R&S USB 2.0 compliance test software provides an automated solution for performing physical layer tests on USB 2.0/1.1/1.0 interfaces. It covers devices, hubs and hosts. Integrated into the R&S® ScopeSuite software, the solution allows experts and novices alike to complete their tests quickly.

Issue:  KIPiS 2014 #3
This article proposes a fundamental troubleshooting technique using the latest oscilloscope features following the basic theme of «if you can’t see the problem, you can’t fix the problem».

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2014 #3
At the moment the main progress trend of measuring technology is the production of integrated devices, those which can combine several measuring instruments within a single housing. This trend can’t be considered new. Several wellknown manufacturers have already announced their new multifunctional devices including portable ones. However the progress keeps on moving further. Thus in spring 2014 AKTAKOM family of handheld oscilloscopes-multimeters has been updated and replenished with 10 new models of ADS-4000 series handheld combined oscilloscopes. This article is a very detailed presentation of this innovative AKTAKOM ADS-4000 series.

Issue:  KIPiS 2014 #3
The end of May is marked by the outstanding event in the metrology world — 10th Anniversary Moscow International Forum «Precision Measurements are The Basis of Quality and Safety» was held on May 21-23. Find more details and learn what the leading metrologists and specialists consider crucial to solve the most important questions in Russian metrology.

Author(s):  Levin S.
Issue:  KIPiS 2014 #3, KIPiS 2014 #4
In this article you will find very interesting facts about the beginning of space research as well as about those who were the originators in this sphere.

Issue:  KIPiS 2014 #2
When a company has some new interesting developments it tries to demonstrate it and show all advantages. Therefore they usually organize different events, seminars and press-conferences. Thus on March 18 Fluke Corporation held a special press-event dedicated to new series of infrared cameras: Ti200, Ti300 and Ti400. These new devices have lots of innovative characteristics, for example: LaserSharp ™ AutoFocus that tells you exactly where you are focusing, SmartView® Mobile application for the connection to iPhone and iPad, patented Fluke IR-Fusion ® technology with AutoBlend™ mode for much faster detection and communication and many other features which are worth seeing.

Issue:  KIPiS 2014 #2
AWR Corporation, the innovation leader in high-frequency EDA, together with its partners, Softline and WIN Semiconductors, organized seminar series named «AWR Design Forum 2014». One of them was held in Moscow on February 25. February 27 was the date for the seminar held in St. Petersburg. During this well-organized event AWR specialists demonstrated in a very detail the work of the leading company products: Microwave Office (the most comprehensive software solution for designers of all types of RF and microwave circuits), a complete software suite Visual System Simulator, Analog Office (unique software that offers an easy-to-use, flexible and accurate design environment), AXIEM (3D planar electromagnetic (EM) analysis software, a valuable addition to the AWR Design Environment™), Analyst (powerful 3D FEM EM simulation and analysis software that is seamlessly integrated within the AWR Design Environment ™).

Issue:  KIPiS 2014 #2
By now, you’ve probably heard that Agilent Technologies is spinning off its electronic measurement business as a standalone company. On January 7, 2014 the name of this company was announced: Keysight Technologies. Between now and November 2014, when the company become an independent operation, numerous changes will happen behind the scenes, and some will occur in public for all to see. In the present article Agilent will focus on providing some answers: the meaning embedded in the new name, the key things that will remain the same, two positive elements that will be different, and evidence of its ongoing commitment to customer success.

Author(s):  Davidson, Scott
Issue:  KIPiS 2014 #2
With complexity on the rise, modern mixed signal designs are proving to be a worthy adversary to designers. Embedded design engineers are having to wear multiple hats in order to efficiently troubleshoot and debug the latest designs. Debugging today’s designs requires working in a mixed domain environment, from DC to RF, with analog and digital signals, and serial and parallel buses. That means a modern measuring device should be combined and needs to give designers a more comprehensive set of functions and features to support efficient verification and debugging of embedded designs. To meet this need Tektronix has developed a new integrated oscilloscope MDO3000 that combines 6(!) instruments in a single small, portable package able to provide insight into both time and frequency domains. Find more in the present article.

Issue:  KIPiS 2014 #2
Semiconductors have been widely used in different areas since long ago. Almost all electronic devices contain semiconductor electronic components such as diodes, thyristors and transistors etc. Therefore one of the important measurement tasks in demand is their automatic test and characteristics measurement. This measurement task can be easily and reasonably solved by Keithley 2400 and 2600 A/B series sourcemeters together with graphical environment Lab Tracer. Read about advantages of such system in the present article.

Author(s):  Lemeshko N.
Issue:  KIPiS 2014 #2
The present article introduces the method to measure absolute electric area of alternating pulses using math waveforms. There is a detailed analysis of the mostly used pulse measurement methods given within this article as well as the acceptability assessment for the specified parameter. From this article you will get to know about the necessary requirements to oscilloscopes for this measurement type and see measurement examples of complex signals received using R&S RTM series oscilloscope.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2014 #2
As we already informed in one of our previous KIPiS issues (namely ¹6, 2013) RIGOL Technologies, Inc. introduced many innovative products at international Hong Kong Electronics Fair in October 2013. Last time we prepared a special article about DS1000Z digital oscilloscopes. This time we’d like to introduce a detailed review of new Rigol DG1000Z digital signal generators and DSG3000 RF signal generators. Full and informative description of specifications and advantages — all of this can be found in the present article.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2014 #2
Why are there special instruments or additional probes needed for measurements with an oscilloscope in 220V network? This topic seems to be rather well-known. But often users chose a wrong oscilloscope for this kind of measurement and it’s a typical mistake. The present article introduces a solution for this measurement task.

Issue:  KIPiS 2014 #1
On January 22 Agilent Technologies organized a special press-event. General Director of Agilent in Russia Galina Smirnova showed a presentation and announced new details concerning the separation of Agilent into two publicly traded companies. One of them will work in the sphere of chemical analysis, life sciences and diagnostics under Agilent name and the second will be 100% devoted to test and measurement world and completely support electronic market. It’s name will be Keysight Technologies. Find more details about the reorganization and the dates when these two companies become independent.

Issue:  KIPiS 2014 #1
November 28-29, 2013 at the Congress Hall MTUCI passed twelfth international scientific and practical conference «NIDays-2013». Conference was attended by more than 450 business leaders, engineers, professors, teachers and students. At the conference there were five technical sessions, where more than 50 speakers made their presentations. Also there was a poster session, with more than 60 poster presentations. At the conference there was a great exhibition of technology NI, where there were more than 30 demonstrations.

Issue:  KIPiS 2014 #1
On January 29, 2014, within DesignCon conference Test & Measurement World announced the winners of Best in Test Award in its various categories. This award is presented annually to those competitors who have managed to develop the most important and innovative products and services in electrical and instrumentation industry.

Author(s):  Herdin, Marcus
Issue:  KIPiS 2014 #1
Previously oscilloscopes were hardly used to fight with EMI. They lacked sensitivity necessary for EMI detection, their functions of spectral analysis with the help of FFT hadn’t been developed enough and were difficult in use. The situation has changed with new digital oscilloscope R&S RTO from Rohde & Schwarz. Sensitivity of 1 mV/div and 4 GHz bandwidth including very low inherent noise level make this oscilloscope perfect for signal analysis in induction zone for the detection and analysis of emitted electromagnetic interference. Find more about Rohde & Schwarz oscilloscope in the present article.

Author(s):  Chang, Jae-yong
Issue:  KIPiS 2014 #1
In oscilloscopes or oscilloscope probes, bandwidth is a measure of the width of a range of frequencies measured in Hertz. Utilizing the built-in mathematical capabilities available in modern digitizing oscilloscopes, it is possible to derive the frequency response or the bandwidth characteristics of a probe based on the measured step response of a fast step signal. Among those several test methods, the time domain approach is the easiest to duplicate without needing expensive test instruments.

Author(s):  Hulbert, Peter J.
Issue:  KIPiS 2014 #1
Emerging NVM materials and device types require electrical characterization that traditionally has not been available or required custom in-house test systems, which had limited capabilities. New instrumentation is now available that provides pulse sourcing with simultaneous measurement that permits characterization of the underlying switching behavior that is key to understanding NVM performance.

Author(s):  Afonskaya, Tatiana , Afonskiy, Alexander
Issue:  KIPiS 2014 #1
The most attended exhibition in the world International CES 2014 was held in Las Vegas (Nevada state, USA) on January 7-10, 2014. The motto of this year exhibition was «What else could be offered for your smartphone?». In order to meet customers’ requirements and needs manufacturers do their best to offer a huge number of various applications for smartphones. Thus some of the demonstrated applications were really useful, others seemed rather strange at first sight moreover some of them could even puzzle you. Find more about the world of applications introduced at International CES 2014 as well as about innovative products that made first debut this year during this great show.