Measurement of diode forward and reverse volt-ampere characteristic using Keithley 2400 sourcemeter

Semiconductors have been widely used in different areas since long ago. Almost all electronic devices contain semiconductor electronic components such as diodes, thyristors and transistors etc. Therefore one of the important measurement tasks in demand is their automatic test and characteristics measurement. This measurement task can be easily and reasonably solved by Keithley 2400 and 2600 A/B series sourcemeters together with graphical environment Lab Tracer. Read about advantages of such system in the present article.
Issue:  KIPiS 2014 #2