Lemeshko N.

The article describes the expanded signal analysis capabilities based on measurements with postprocessing implemented using hardware and software options of modern digital oscilloscopes. There is also prerequisite analysis made for the development of such options, as well as their classification introduction. The present article will inform you of the whole range of practical tasks that can be solved with the options functional capabilities of R&S RTO and R&S RTP series oscilloscopes as one of the most advanced measuring instruments in the market.

In the present article based on the purpose analysis of the transceiver modules and their typical structural diagram the authors have identified the typical EMC problems for which characteristics they may use the typical indicators. Basing on the operating modes of the transceiver modules, which corresponds to the highest noise emission and the lowest noise immunity, the authors suggest the general schemes for measuring the above EMC indicators using Rohde & Schwarz solutions and consider the key points in terms of preparation for such measurements.

The current article describes the issues of the phase noise measurements of pulsed modulation signals that are widely used in radio detection and location. The authors analyze the spectral features of such signals and theoretical limitations determined by the pulse operation mode; estimate the dependence of the noise parameters on the modulating pulses characteristics; consider the digital phase demodulation method with cross-correlation processing; describe the functional features of R&S FSWP analyzers. Also they describe the principle and example of pulse-modulated carrier signal processing in R&S FSWP analyzer as well as the example of measuring the amplitude and phase stability of pulsed-modulated signals.

The present article demonstrates the state-of-the-art capabilities of jitter analysis in high-speed digital devices by the example of R&S RTO-K12 option. The author suggests analyzing the reasons that may cause jitter, classification of its components and the main approaches to its reduction, as well as the typical consequences of this phenomenon appearance when operating digital devices. This article also demonstrates the existing methods of jitter analysis and shows examples of measurements using R&S RTO-K12 option to estimate temporal and statistical characteristics of digital signal jitter.

In the present article they consider the question of spectrum analyzers use when solving electromagnetic compatibility problem. Here you will find the analysis of the main tasks in the field of EMC and also read about the advantages of handheld spectrum analyzers comparing to the nonportable laboratory devices. In this article R&S FSH series spectrum analyzers are compared to the initial and average level devices which may help you to see the way they can replace each other when solving the described tasks.