RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

Keysight’s 64 GBaud bit error ratio tester secures PCI-SIG approval for compliance test measuring of PCIe 4.0 technology

Keysight’s 64 GBaud bit error ratio tester secures PCI-SIG approval for compliance test measuring of PCIe 4.0 technology

05/11/2021

Keysight Technologies, Inc. announced that the company's M8040A 64 Gbaud High-performance bit error ratio tester (BERT) was approved by the PCI-SIG as a compliance test measuring instrument for PCI Express 4.0 (PCIe Gen4) testing at 16 gigatransfers per second (GT/s) and 8GT/s. Keysight is the only test vendor with two BERT systems approved by the PCI-SIG for testing PCIe 4.0 and PCIe 3.0 technologies.

As serial bus technologies increase in speed and bandwidth, test equipment vendors are tasked with delivering tools capable of testing beyond the state of the art. Keysight's BERT system enables accurate physical-layer design verification of high-speed communication and multigigabit digital interfaces. Keysight M8040A 64 Gbaud High-performance BERT is the only PCI-SIG approved receiver test BERT for PCIe 4.0 capable of testing PCIe 5.0 (32GT/s) and enables pathfinding (the process of selecting a design choice by evaluating different technical approaches against a set of defined system parameters and goals) for the emerging PCIe 6.0 (64GT/s) speeds.

Read more.

www.keysight.com


Company profile:  Keysight Technologies

Back to the list


Related Information:

Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search