RU |
Login
Newsletters
There is no newsletter category found. Information
|
Agilent Technologies Announces 30 MHz Function/Arbitrary Waveform Generators with Unparalleled Signal Accuracy08/31/2010 Agilent Technologies Inc. (NYSE:A) introduced the 33521A 1-channel function/arbitrary waveform generator and the 33522A 2-channel function/arbitrary waveform generator. The 33521A and 33522A are members of the Agilent 33500 Series family of function/arbitrary waveform generators.
The generators provide the lowest total harmonic distortion and jitter in their class. The generators' large graphical display allows for simultaneous parameter setup, signal viewing and editing. The generator also offers more precise functions and true point-by-point arbitrary waveforms that are alias-protected for exceptional accuracy.
"With full-bandwidth pulses and real point-by-point arbitrary waveforms, the new 33500 series generators deliver the highest fidelity in their class," said Gary Whitman, vice president and general manager, Agilent's System Products Division. "R&D and manufacturing engineers will experience a new level of accuracy and flexibility, offering more precise validation of their designs and devices during test."
The Agilent 33500 Series function/arbitrary waveform generators feature:
The Agilent 33521A and 33522A function/arbitrary waveform generators are fully compliant with the LXI Class C Specification. The generators include USB 2.0 and 10/100 Base-T Ethernet (LAN) for quick and easy connectivity to a PC or a network. A built-in Web page allows remote operation of the instrument from any browser. The 33500 Series of generators can connect with Agilent's current line of function/arbitrary waveform generators (33210A, 33220A, 33250A) using the GPIB interface option.
For more information and video demonstrations about Agilent's 33521A and 33522A function/arbitrary waveform generators, go to www.agilent.com/find/33500.
Agilent Technologies, www.agilent.com Company profile: Keysight Technologies Related Information:
Companies' news
KIPiS articles
KIPiS News & Events
|
Current issue
Search
|
© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2024 |