RU |
Login
Newsletters
There is no newsletter category found. Information
|
Companies' news
09/14/2010 | 2498
Agilent Technologies expanded its test and measurement portfolio into the modular domain with the introduction of 46 new PXI and AXIe products. The new products bring Agilent's measurement expertise - including advanced measurement software and high-performance hardware - to the modular form factor. These products also will enable new capabilities that were not previously available across analog, digital, RF, microwave and lightwave test technologies.
09/14/2010 | 2926
National Instruments announced NI VeriStand 2010, which includes enhancements that expand its capabilities for hardware-in-the-loop (HIL) and real-time testing by supporting high-performance, multiple chassis PXI systems and low-cost, ruggedized options using NI CompactRIO and NI Single-Board RIO hardware deployments. NI VeriStand 2010 also features enhanced connectivity with NI LabVIEW, making it easier for engineers to reuse existing software and further customize their NI VeriStand applications.
09/10/2010 | 2462
Tektronix, the market leader in broadcast video test, monitoring and analysis solutions, announced that it has obtained Type Approval Certificates in Russia for several of its compressed and uncompressed video test solutions.
09/09/2010 | 3004
National Instruments announced the NI PXIe-4844 optical sensor interrogator, a two-slot 3U PXI Express module for fiber Bragg grating (FBG) sensors. Unlike conventional electrical sensors, FBG sensors are nonconductive, electrically passive and immune to electromagnetic interference, making them a safe and reliable alternative in environments subject to noise, corrosion or extreme weather.
09/08/2010 | 2310
Agilent Technologies Inc. (NYSE: A) today introduced new, thematic skins for the U1240 and U1250 Series handheld digital multimeters (DMMs). The new skins allow engineers and technicians to personalize their DMMs, which are used to perform everyday measurements and troubleshooting tasks.
09/03/2010 | 3981
At the European Microwave Week 2010 in Paris (CNIT/Pierre & Marie Curie, booth 70/69), Rohde & Schwarz proves its leading role in microwave T&M with new T&M solutions up to 500 GHz. The numerous highlights include the R&S FSVR real-time spectrum analyzer up to 30 GHz, the R&S SMZ frequency multiplier up to 110 GHz as a practical supplement to the R&S SMF100A signal generator, as well as network analysis up to 500 GHz based on the R&S ZVA high-end network analyzer from Rohde & Schwarz. In addition, the company will present its two new oscilloscope families with bandwidths ranging from 500 MHz to 2 GHz.
09/01/2010 | 4089
Visit the Tektronix stand 8.C75 (Hall 8) at IBC this year to get expert advice and hands-on demonstrations with latest test and monitoring equipment. IBC 2010 will take place from 10 to 14 September 2010, RAI Amsterdam, Netherlands.
08/31/2010 | 2282
Agilent Technologies Inc. (NYSE:A) introduced the 33521A 1-channel function/arbitrary waveform generator and the 33522A 2-channel function/arbitrary waveform generator. The 33521A and 33522A are members of the Agilent 33500 Series family of function/arbitrary waveform generators.
08/19/2010 | 2872
Anritsu’s ME7873L RF Conformance Test System and ME7832L Protocol Conformance Test System for testing LTE mobile terminals have already received GCF approval and now have received PTCRB approval for 30 (ME7873L) and 20 (ME7832L) test cases supporting the wireless bands used in North America (Band 4, 13, 17, etc.)
Handheld Spectrum Analyzer Agilent N9342C Makes Infield Measurements Easier, Faster and More Precise
08/17/2010 | 2718
Agilent Technologies Inc. (NYSE: A) introduced the N9342C handheld spectrum analyzer (HSA), a powerful and straightforward instrument designed for RF technicians and engineers performing installation, maintenance and surveillance of RF systems in the field. The N9342C HSA makes field testing easier by providing faster, more precise measurements, ease of use, and a range of user customization and ergonomic features.
|
Current issue
Search
|
© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2024 |