KIPiS articles

Issue:  KIPiS 2013 #6
After four days, the outcome of the 20th productronica was very positive: About 38,000 visitors from 83 countries participated in the international trade fair for innovative electronics production in Munich. Compared to 2011, there was another sharp increase in the number of visitors from abroad — especially from non-EU countries. Above all, there were large increases in the number of visitors from the Russian Federation, China and Turkey. Overall, the share of international visitors increased from 48 percent to 52 percent. Among other things, the quality of the trade visitors was reflected by concrete business transactions.

Author(s):  Afonskaya, Tatiana , Borovskaya M.
Issue:  KIPiS 2013 #6
International Exhibition of Testing Equipment, Systems and Technologies of Aerospace Industry — Aerospace Testing Russia — is one of the key events for leading specialists representing knowledge- intensive industries. The exhibition was held on October 22-24 and managed to unite over 90 companies from 11 countries. Simultaneously with this exhibition there was one more new exhibition held named Industrial Testing & Control. Also there was two-day All-Russian Scientific- Technical Conference «Metrological Support of Testing and Measurements in Aerospace Industry» where more than 170 specialists of aerospace industry gathered to discuss the most crucial questions of this area.

Issue:  KIPiS 2013 #6
As usual October was the time for the greatest Hong Kong shows — China Sourcing Fair (Oct. 12-15) and exhibitions-twins Hong Kong Electronics Fair (Autumn edition) and electronicAsia (Oct. 13-16). Over 100000 buyers and 4000 exhibitors from 140 countries! These shows have broken the last year record.

Issue:  KIPiS 2013 #6
An interview with Benoit Neel, Vice President and General Manager of EMEA, Electronic Measurement Group of Agilent Technologies

Issue:  KIPiS 2013 #6
Interview with Vladimir Lahov, Deputy Director of VNIIMS

Author(s):  Hoppin, Tom
Issue:  KIPiS 2013 #6
Precise power measurements are critical to ensuring the performance and compliance of modern communication and radar systems. While there are certainly a large number of options available for making these measurements, each comes with its own set of trade-offs. For field measurements, use of a tuned receiver like the FieldFox spectrum analyzer with built-in CPM offers users better sensitivity, a higher dynamic range, short measurement times, and no warm-up time, with only slightly reduced measurement accuracy as compared to a power sensor.

Author(s):  Lemeshko N.
Issue:  KIPiS 2013 #6
The present article contains the evaluation of the use of highly sensitive digital oscilloscopes with FFT function for the search of increased emission sources within electronic components. You will get to know about the importance of the problem analyzed as well as the requirements to the measuring means used therefore. The article includes an example that confirms the potential marketability and prospects of the mentioned modern oscilloscopes use.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2013 #6
In October 2013 at international Hong Kong Electronic Fair where the majority of manufacturers demonstrate their innovative products RIGOL Technologies, Inc. introduced new Rigol DS1000Z series oscilloscopes. These oscilloscopes left a very strong impression with their design and what is the most important with their parameters and capabilities. Such characteristics may make these innovative devices best-sellers both in Russian and world markets of measuring equipment. Find more details about these oscilloscope specifications in the present article.

Issue:  KIPiS 2013 #5
Hammond Hilton, Product Marketing Manager for oscilloscopes/multimeters ScopeMeter® series, Fluke Corporation, has kindly agreed to give an interview to our magazine. Mr. Hilton is saying about Fluke ScopeMeter test tools, marketing programs which have been prepared in order to promote the oscilloscopes/multimeters on the Russian market and what the oscilloscope of tomorrow is to his point of view.

Issue:  KIPiS 2013 #5
The present interview was given to our magazine by Joseph Bingold, SAPL Marketing Manager at Tektronix Inc. You will find out which products of SAPL Tektronix product line are the leaders nowadays, what the main points in the development strategy for spectrum analyzers are as well as many other interesting details. Also you will get to know about the sales results of Tektronix spectrum analyzers in Russia for today straight from Mr. Bingold’s own lips.

Issue:  KIPiS 2013 #5
On September 19 Agilent Technologies held an informative press-event dedicated to new solutions of the company in test and measurement. Find more information about technical modernization of signal analyzers, logic analyzers and power supplies.

Issue:  KIPiS 2013 #5, KIPiS 2013 #6, KIPiS 2014 #1, KIPiS 2014 #4, KIPiS 2014 #5, KIPiS 2014 #6
Probes are vital to oscilloscope measurements. To understand how vital, disconnect the probes from an oscilloscope and try to make a measurement. It can’t be done. There has to be some kind of electrical connection, a probe of some sort between the signal to be measured and the oscilloscope’s input channel. In addition to being vital to oscilloscope measurements, probes are also critical to measurement quality. In this article you’ll learn what contributes to the strengths and weaknesses of probes and how to select the right probe for your application.

Issue:  KIPiS 2013 #5
Tests such as device efficiency and battery drain analysis measure voltage and current to compute power and other electrical parameters. The accuracy of these tests is directly dependent on the accuracy of the constituent measurements, often targeting a total error of 0.1% or better. At a glance, current measurement might seem like a straightforward application of Ohms law, but measuring large or highly dynamic currents can be deceptively challenging due to range and accuracy limitations in real-world equipment.

Author(s):  Stauffer, Lee
Issue:  KIPiS 2013 #5
Power semiconductors have become a hot market. Semiconductor manufacturers are developing a whole new generation of power devices that boost the efficiency of energy generation, transmission, and consumption. These new devices have created some interesting test challenges. Because they operate at higher voltages than silicon devices, the test equipment must source higher test voltages. At the same time, these devices have lower leakage currents, so the test equipment must be more sensitive to low currents. In response, test equipment manufacturers are introducing source measurement units (SMUs) with wider dynamic ranges.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2013 #5
Nowadays software for measuring devices is not only an accessory as it was before but one of the main features of the device effective use. On the one hand software use allows the remote control of a device (which is a necessary element when making distributed measuring systems), on the other hand it allows the user to automate the repetitive operations (e.g. cyclic tests).

Author(s):  Medler, Jens
Issue:  KIPiS 2013 #4
FFT-based EMI test receivers can be used for EMI compliance measurements in accordance with Amendment 1 to 3rd Edition of CISPR 16-1-1 if this standard is referenced in the product standard. The use is motivated by reducing the scan time by several orders of magnitude and to get more insight due to the possibility of applying longer measurement times and enhanced measurement functions like spectrum in persistence mode. For precise and reproducible measurements the use of preselection filters is highly recommended.

Issue:  KIPiS 2013 #4
Such challenge like the measurement of indoor humidity has its own peculiarity. This peculiarity means tracking the relative humidity changing while using some of the climatic devices as follows: air-conditioners, air humidifiers etc. in order to estimate the efficiency of their use and to set the optimal ranges of their operation. To meet this challenge there is a device needed which can measure humidity and appropriate parameters as well as register the measured values in the memory with capability of plotting graphs. The present article introduces AKTAKOM ATE-5035 humidity/temperature meter, its specifications and features.

Author(s):  Zollo, Bob
Issue:  KIPiS 2013 #4
As DC bias tasks become more sophisticated, involving sequencing and dynamic sourcing and measurement, traditional instruments start to fall short. These tasks will require complex interaction of several instruments and transducers, causing setup and configuration challenges. The DC Power Analyzer represents a new and unique solution to make work easier for the engineer.

Author(s):  Miles, Dean
Issue:  KIPiS 2013 #4
The rapid growth of high-bandwidth applications like on-demand video and cloud-based services conspire to make carrying capacity an absolute top priority. A coherent lightwave signal analyzer allows engineers to understand and optimize optical networks that use advanced modulation such as DP-QPSK.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2013 #4
It is well-known that engineers prefer multifunctional devices. Such devices save space at their desks, usually cost cheaper than two or three devices and what’s the most important — always provide several different measuring functions ready at hand. But nevertheless these features are not the main ones in AKTAKOM multifunctional oscilloscopes ACK-6xx9. These digital storage oscilloscopes have become among the first ones low-end oscilloscopes with built-in digital signal generator presented in Russia. The article gives several examples of efficient use of AKTAKOM ACK-6xx9 digital oscilloscopes with built-in signal generator.