Addressing the challenges of multiport and multi-site test
When selecting your VNA test solution
for multiport devices, you need to
consider switch loss, system calibration
and other factors affecting test throughput
and accuracy. Advances in test and
measurement technologies have enabled
multiport and multi-site test solutions to
better address these challenges by increasing
the number of measurements,
the number of devices and measurement
speed, while maintaining high accuracy
and stability.
Author(s):
Hirato, Takuya
Issue:
KIPiS 2017 #5
