National Instruments Brings Semiconductor ATE Digital Capability to PXI

National Instruments, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor. This product frees manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment (ATE).
Issue:  KIPiS 2016 #5