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Rohde & Schwarz enables the development of next generation automotive radar chips with new high-precision test chamber12/17/2019 Rohde & Schwarz has developed the leading-edge R&S ATS1500C antenna test system, a test chamber for high performance radar testing, offering an outstanding indirect far-field testing performance. This innovation allowed Uhnder to mature the technology behind the first 4D digital automotive radar-on-chip with 192 virtual channels. Automotive radar is one of the key technologies that drives progress in the advanced driver assistance systems (ADAS) needed for future generations of driverless vehicles. At productronica 2019 in Munich, Rohde & Schwarz provided an early preview of its new solution for testing state-of-the-art, next generation automotive radar sensors. The test system consists of the new, compact R&S ATS1500C automotive radar test chamber for far-field testing, in combination with the R&S AREG100A automotive radar echo generator for precise radar target simulation at various distances. Together, they form a unique and innovative indirect far-field testing solution for reliable and reproducible verification of radar sensors throughout the R&D and validation phase in a user-friendly and extremely compact lab setup. The solution enabled the precise calibration and verification of Uhnder's new, fully integrated 4D digitally modulated automotive radar-on-chip (RoC). The R&S ATS1500C features a high accurate compact antenna test range (CATR) reflector, generating a 30 cm diameter quiet zone for testing in the frequency range from 77 - 81 GHz. Its high-precision 3D tilt-tilt positioner permits testing of premium automotive radars. A carefully designed absorber layout eliminates ghost targets during simulation. From January 7 to 10, 2020, Rohde & Schwarz and Uhnder will jointly showcase the R&S ATS1500C test solution at CES 2020 in Las Vegas. Company profile: Rohde & Schwarz Related Information:
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