RU |
Login
Newsletters
There is no newsletter category found. Information
|
Agilent Technologies Introduces Oscilloscopes with Breakthrough Technology to Deliver Advanced Capabilities for Engineers, Technicians with Limited Budgets02/23/2011 Agilent Technologies Inc. (NYSE: A) expanded its mixed-signal and digital-storage oscilloscope portfolio with 26 new models that comprise its next-generation InfiniiVision 2000 and 3000 X-Series. The new scopes incorporate breakthrough technology that allows advanced capabilities to be included in affordable instruments.
The new Agilent InfiniiVision 2000 X-Series offers bandwidths from 70 MHz to 200 MHz and boasts the fastest waveform update rate in its class for superior viewing of signal detail and capture of infrequent events. First-in-class optional 8-channel mixed-signal oscilloscope (MSO) capability and the industry's only optional integrated function generator offer more capabilities to engineers and educators with highly constrained equipment budgets.
The new Agilent InfiniiVision 3000 X-Series scopes step up performance while aggressively holding prices in line, offering bandwidths from 100 MHz to 500 MHz and industry-leading waveform update rates of 1,000,000 waveforms per second. Options include a 16-channel MSO, an integrated function generator, and hardware-accelerated serial protocol decode.
Electronic design and test teams in nearly every industry, including the computer, communications, semiconductor, aerospace/defense, automotive and wireless industries, continue to produce increasingly sophisticated hardware. Engineers and technicians use oscilloscopes as their primary tools to test and debug those designs. In addition, educators need affordable, industry-grade oscilloscopes to help prepare the next generation of engineers for success.
"The new Agilent InfiniiVision X-Series oscilloscopes will revolutionize the field of engineering education," said Adam Fontecchio, Ph.D., co-director of the A. J. Drexel Nanotechnology Institute at Drexel University. "The ability to upgrade hardware capabilities after purchase through software add-ons opens new possibilities for continually updating course content to adapt to the changing needs of global engineering markets and to keep our engineering students on the cutting edge of instrumentation and practical skills."
The heart of the InfiniiVision X-Series scopes is an Agilent-designed custom 90-nm CMOS ASIC with 6M gates and embedded memory. This MegaZoom IV single-chip architecture enables the industry's fastest waveform update rates and responsive deep memory along with integrated logic analyzer, function generator, and protocol analyzer functionality so engineers and educators have highly advanced scope performance at economical prices.
"Because of our deep technology capabilities, Agilent is uniquely qualified to deploy leading-edge technology to solve customer problems," said Jay Alexander, vice president and general manager of Agilent's oscilloscopes business. "With the InfiniiVision 2000 and 3000 X-Series, we focused on delivering industry-leading signal viewing capabilities, and we added options for an integrated function generator and brought our MSO technology into the economy scope segment for the first time."
Agilent InfiniiVision X-Series oscilloscopes offer compelling benefits for engineers and technicians to:
"Oscilloscopes are a core product category for Agilent," said Ron Nersesian, president of Agilent's Electronic Measurement Group. "The addition of the value-based InfiniiVision 2000 and 3000 X-Series scopes to our portfolio, which also includes the industry-leading Infiniium line of performance scopes with true analog bandwidth up to 32 GHz, demonstrates our sustained commitment to growing the business."
Additional information on Agilent's new InfiniiVision 2000 X-Series and 3000 X-Series oscilloscopes and the company's complete line of oscilloscopes is available at www.agilent.com/find/InfiniiVisionX-Series.
Agilent Technologies
Company profile: Keysight Technologies Related Information:
Companies' news
KIPiS articles
|
Current issue
Search
|
© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2024 |