RU |
Login
Newsletters
There is no newsletter category found. Information
|
Companies' news
08/21/2013 | 2049
Agilent Technologies Inc. (NYSE: A) announced the availability of scanning microwave microscopy (SMM) capabilities for its premier-performance atomic force microscope, the 5500 AFM. Agilent's second-generation SMM nose cone makes this unique electrical measurement option compatible with the 5500 system.
08/19/2013 | 3715
Building upon its robust embedded processing software and tools ecosystem, Texas Instruments (TI) (NASDAQ: TXN) announced a new class of JTAG emulator, the XDS200 for $295. This new emulator can be utilized for hardware debugging, algorithm development and programming on TI’s embedded processors. Providing a great balance of cost and performance, the XDS200 emulator fits in the overall TI emulator portfolio between the entry-level XDS100 JTAG emulator and the XDS560v2 JTAG emulator with system trace receiver. XDS200 JTAG emulators support a USB connection to the host computer and work with 32- and 64-bit versions of Microsoft Windows and Linux operating systems.
08/14/2013 | 2553
Rohde & Schwarz has expanded its successful R&S ESR family by adding a model for up to 26.5 GHz. This means that high measurement speeds and comprehensive diagnostic tools are now also available for EMC certification testing in line with the FCC standard and measurements in line with military standards.
08/12/2013 | 2175
The new NI cRIO-9068 software-designed controller is part of the most advanced and open system design platform for embedded control and monitoring systems.
08/07/2013 | 2034
Agilent Technologies Inc. (NYSE: A) announced the industry's first MIPITM M-PHY physical layer receiver and transmitter tests with switch automation. The tests are designed to accelerate the turn-on and debug of MIPI M-PHY-based systems and to provide design engineers an efficient way to ensure their M-PHY devices will interoperate with the application processor.
08/05/2013 | 1746
Atmel® Corporation (NASDAQ: ATML), a global leader in microcontroller and touch technology solutions, announced the availability of a new maXTouch® family to enable single-layer shieldless designs in automotive center stacks, navigation systems, radio interfaces or rear seat entertainment systems. Atmel’s mXT336S is optimized for 7-inch touchscreens, while the mXT224S targets smaller touchscreens and touchpads.
08/02/2013 | 1908
Starting in the lab, developers must perform extensive tests on the receivers and components used in satellite-based navigation systems, such as testing location based services on smartphones, car navigation units and aircraft control systems. The R&S SMBV100A from Rohde & Schwarz now offers valuable support. New options expand the range of functions of its GNSS simulator by adding a series of realistic scenarios.
07/29/2013 | 2072
National Instruments announced NI LabVIEW software- and NI hardware-compatible mobile apps for iPhone, iPad and Android devices, helping engineers integrate the latest mobile technology into their applications. By combining the portability, ease of use, faster start-up time and longer battery longevity of mobile devices with the power of LabVIEW, engineers can more productively access measurement data from data acquisition and embedded monitoring systems.
07/24/2013 | 2004
Agilent Technologies Inc. (NYSE: A) announced that Millitech Inc., a leading provider in millimeter-wave components, assemblies and subsystems for applications in satellite communications, radiometry, radar and remote sensing, has selected Agilent's Electromagnetic Professional (EMPro) and Advanced Design System (ADS) software for use in developing mixers, multipliers and various passive devices.
07/22/2013 | 2536
R&S MR6000A software defined radios from the successful R&S M3AR product family are already in operation in many military airborne platforms. As part of the A400M program, the radios have now been optimized even further: They are currently the only airborne transceivers of their kind worldwide to meet civil aviation authorities' certification criteria.
|
Current issue
Search
|
© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2024 |