RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

Companies' news

RSS

04/01/2016 | 1424
Keysight Technologies Introduces Industry's Most Usable Browser Head for InfiniiMax II Probes Keysight Technologies, Inc introduced the N2839A differential browser head for use with InfiniiMax I/II Series probe amps, bringing the measurement fidelity of a solder-in probe head to hand-held browsing. When used with the InfiniiMax II 1169A probe amplifier, the N2839A gives users 12 GHz of bandwidth, making this the world's most usable hand-held browser solution for measuring high-speed differential or single-ended signals.

03/29/2016 | 1381
TI introduces industry's highest-performance wideband RF phase-locked loops with integrated voltage-controlled oscillators Texas Instruments introduced the industry's highest-performance phase-locked loops (PLLs) with integrated voltage-controlled oscillators (VCOs). Delivering the lowest phase-noise performance in the industry, the LMX2582 and LMX2592's single-chip architecture helps designers achieve a level of performance previously possible only through several discrete devices.

03/25/2016 | 1696
Tektronix Debuts Family of Compact, Standalone DC Electronic Loads Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, introduced the Keithley Series 2380 family of compact, standalone DC Electronic Loads as a compliment to the company's complete set of power test and measurement solutions. Available in 200W, 250W and 750W models, the new DC Electronic Loads offer excellent performance, competitive pricing and the versatility to handle a wide range of applications including performance verification, stress test and environmental test of DC power sources, power components and batteries in power electronics, LED lighting, battery research, automotive and alternative energy.

03/22/2016 | 1530
Anritsu Introduces Enhanced SkyBridge Tools That Shortens DAS Testing Times by as Much as 90% Anritsu Company introduces a new version of its award-winning SkyBridge Tools™ cloud-based test management tool that reduces the time associated with testing and verifying distributed antenna systems (DAS) by as much as 90%. With enhanced features, SkyBridge Tools can serve as a DAS Test Management Tool that automatically creates detailed test plans based upon easily imported test criteria to greatly simplify installation and commissioning of in-building wireless systems for more timely reimbursement of completed work.

03/18/2016 | 1498
Keysight Technologies' RF and RRM Conformance Test System Leads Industry in PTCRB RF LTE 3CA Certification Keysight Technologies, Inc. announced that the new Keysight T4010S test platform leads the industry in the number of PTCRB RF 3CA certification test cases supported and bands covered.

03/15/2016 | 1432
Verify compliance of embedded multimedia card interfaces with R&S RTO oscilloscopes from Rohde & Schwarz Embedded multimedia cards (eMMC) are inexpensive internal storage media that are mainly used in mobile electronic devices in the consumer and industrial sectors. With new compliance test software for the R&S RTO oscilloscope family, Rohde & Schwarz now covers automated conformity tests for eMMC interfaces. R&S ScopeSuite, the central application for the control of all compliance tests, also offers new capabilities for integration and regression testing.

03/11/2016 | 1453
NI Announces Flexible LTE-U/LAA Testbed NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced a system for testing, experimenting on and prototyping new LTE Unlicensed (LTE-U) and/or License Assisted Access (LAA) wireless access technologies. Though 5G has generated significant interest and focus, new technologies such as LTE-U and LAA are needed today to enhance the 4G data experience and help close the gap until 5G arrives.

03/08/2016 | 1659
Keysight Technologies Unveils Latest Release of its Semiconductor Device Modeling and Characterization Software Tool Suite Keysight Technologies, Inc. (NYSE: KEYS) announced the newest release of its industry-leading device modeling and characterization software suite: Integrated Circuits Characterization and Analysis Program (IC-CAP) 2016, Model Builder Program (MBP) 2016, and Model Quality Assurance (MQA) 2016. The software release provides designers characterizing and modeling semiconductor devices with further advances in modeling and characterization efficiency.

03/04/2016 | 1557
Rohde & Schwarz supports 5G with innovative test setups for the mobile network of the future The services and applications that 5G will provide as well as the technologies will that make them possible have not yet been defined. However, even today, it is clear that it will be necessary to transmit extremely broadband signals up into the millimeter wave range. Rohde & Schwarz supports the many research activities to make this spectrum usable for 5G.

03/01/2016 | 1532
Anritsu Demonstrates 1 Gb/s LTE-A Throughput Using Qualcomm Snapdragon X16 LTE Modem Anritsu Company announces it has successfully demonstrated peak throughput for an LTE-Advanced (LTE-A) device and network simulator using 3x Carrier Aggregation (3CA) and 4x4 MIMO with 256QAM modulation. Utilizing devices featuring the new Qualcomm® Snapdragon™ X16 LTE modem, a product of Qualcomm Technologies, Inc. a subsidiary of Qualcomm Incorporated, and the Anritsu MD8430A LTE Simulator, Anritsu is able to successfully show support for stable IP-layer data rates of up to 1 GBit/s in the downlink.


Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search