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10/28/2013 | 2021
Agilent Technologies and University of Washington Collaborate to Build Embedded Systems Teaching Laboratory Agilent Technologies Inc. and the University of Washington announced they will work together to upgrade a laboratory in the school's Electrical Engineering Department with the industry's latest electronic test equipment.

10/09/2013 | 2340
Agilent Technologies Extends Reach of Its Signal Generators and Analyzers Agilent Technologies Inc. (NYSE: A) introduced a line of frequency-extension modules from Virginia Diodes Inc. (VDI), a company that designs, manufactures and sells millimeter-wave and terahertz devices, components and systems, for its signal generators and analyzers.

09/23/2013 | 2069
Agilent Technologies Introduces 28.4-Gb/s Multiplexer with De-emphasis Option Product Enables Accurate Characterization of Receivers Used in Servers, Storage Systems and Data-Center Networks.

09/04/2013 | 1890
Agilent Technologies and Tyndall National Institute Open State-of-the-Art Teaching and Research Laboratory Agilent Technologies Inc. (NYSE: A) and Tyndall National Institute at University College Cork officially opened a new laboratory for research and teaching in next-generation wireless communications. This state-of-the-art laboratory at Tyndall will enable advanced training and research on radio frequency integrated circuits for high-speed wireless data communications for video applications and contactless sensors for biomedical and security applications.

08/21/2013 | 2047
Agilent Technologies Adds Scanning Microwave Microscopy Mode to Flagship 5500 AFM System Agilent Technologies Inc. (NYSE: A) announced the availability of scanning microwave microscopy (SMM) capabilities for its premier-performance atomic force microscope, the 5500 AFM. Agilent's second-generation SMM nose cone makes this unique electrical measurement option compatible with the 5500 system.

08/07/2013 | 2032
Agilent Technologies Announces Industry's First MIPI M-PHY Receiver and Transmitter Tests with Switch Automation Agilent Technologies Inc. (NYSE: A) announced the industry's first MIPITM M-PHY physical layer receiver and transmitter tests with switch automation. The tests are designed to accelerate the turn-on and debug of MIPI M-PHY-based systems and to provide design engineers an efficient way to ensure their M-PHY devices will interoperate with the application processor.

07/24/2013 | 2002
Agilent Technologies' 3-D EM Simulation Software Selected by Millitech for Mixer, Multiplier and Passive Device Development Agilent Technologies Inc. (NYSE: A) announced that Millitech Inc., a leading provider in millimeter-wave components, assemblies and subsystems for applications in satellite communications, radiometry, radar and remote sensing, has selected Agilent's Electromagnetic Professional (EMPro) and Advanced Design System (ADS) software for use in developing mixers, multipliers and various passive devices.

07/10/2013 | 1982
Agilent Technologies Introduces FPGA Development Kit for High-Speed Digitizers Powered by Mentor Graphics The U5340A enables customers to deploy advanced real-time signal processing into the FPGAs on board Agilent high-speed digitizers. The development kit leverages the full density and speed of the FPGA while ensuring the digitizer's outstanding multi-gigasample-per-second performance.

07/01/2013 | 1919
Agilent Technologies Introduces Industry's First Solution for Modeling Power Devices Agilent Technologies Inc. (NYSE: A) announced that its Integrated Circuits Characterization and Analysis Program (IC-CAP) software has been enhanced to provide full support for the B1505A Power Device Analyzer/Curve Tracer, including the instrument's new high-power, high-current source monitor unit modules.

06/19/2013 | 2173
Agilent Technologies Announces Analysis Software for USB Protocol Analyzers Agilent Technologies Inc. (NYSE: A) announced a new analysis software suite for the U4611A, U4611B and U4612A family of USB protocol analyzers. The suite features the new MegaZoom technology, offering USB device designers quick and easy insight into their designs' behavior, and streamlining USB test and validation.


Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
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