RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

Companies' news

RSS

12/25/2010 | 2837
NI Measurement Studio 2010 Introduces New Support for Microsoft Visual Studio 2010 New version of software simplifies .NET test and measurement application development. Microsoft Visual Studio developers using Measurement Studio 2010 can create Windows Forms and Web Forms applications in a shorter amount of time with increased productivity tools.

12/20/2010 | 2710
NI LabWindows™/CVI 2010 Improves ANSI C Developer Productivity and Simplifies FPGA Communication National Instruments announced the release of new version of NI LabWindows/CVI 2010. New version simplifies test system development for Linux, real-time and FPGA-based systems.

12/04/2010 | 2754
National Instruments Introduces NI TestStand 2010 With Enhanced Team-Based Test Software Development Tools Latest Version of Test Management Software Delivers Advanced Sequence Analyzer, Three-Way File Diff-and-Merge Utility and Enhanced Integration With LabVIEW 2010

10/19/2010 | 2650
National Instruments to Add LTE Automated Test Capabilities to PXI RF Test Portfolio National Instruments announced that it will be adding Long Term Evolution (LTE) test capabilities to its RF test product portfolio with the forthcoming NI LTE Measurement Suite, which operates with PXI RF signal generators and analyzers. Designed for testing 3GPP LTE wireless components, subsystem components and mobile stations, the software-defined test system will provide a fast, flexible and accurate solution for engineers developing automated validation and production test systems for LTE products.

09/14/2010 | 2923
NI VeriStand 2010 Offers Customizable Software and Ease of Use for Increased Reuse, Reduced Time to Market National Instruments announced NI VeriStand 2010, which includes enhancements that expand its capabilities for hardware-in-the-loop (HIL) and real-time testing by supporting high-performance, multiple chassis PXI systems and low-cost, ruggedized options using NI CompactRIO and NI Single-Board RIO hardware deployments. NI VeriStand 2010 also features enhanced connectivity with NI LabVIEW, making it easier for engineers to reuse existing software and further customize their NI VeriStand applications.

09/09/2010 | 3002
National Instruments Introduces Fiber Optic Sensor Interrogator for PXI Express National Instruments announced the NI PXIe-4844 optical sensor interrogator, a two-slot 3U PXI Express module for fiber Bragg grating (FBG) sensors. Unlike conventional electrical sensors, FBG sensors are nonconductive, electrically passive and immune to electromagnetic interference, making them a safe and reliable alternative in environments subject to noise, corrosion or extreme weather.

08/02/2010 | 2287
National Instruments Expands Embedded Vision System Offerings with Camera Link and Windows 7 Options National Instruments announced the addition of Windows OS support and Camera Link connectivity for NI Embedded Vision Systems. Two of the new options featuring Windows support, the NI EVS-1463 and EVS-1464 systems, offer 80 GB storage and are suitable for image and data logging. They are based on the Windows 7 OS, making it possible to develop directly on the deployment system while eliminating the need for a separate PC for the operator interface.

06/28/2010 | 2441
National Instruments Expands NI-XNET Embedded Network Platform With Support for the LIN Communication Bus National Instruments announced new PXI and PCI interfaces that expand the NI-XNET platform to include support for the Local Interconnect Network (LIN) communication bus. New interfaces are ideal hardware-in-the-loop simulation, rapid control prototyping, bus monitoring and automation control.

06/21/2010 | 2391
National Instruments Announces New Products for Connecting NI LabVIEW to Industrial Networks New interfaces for PROFIBUS, FOUNDATION Fieldbus and DeviceNet allow engineers to add high-speed measurements, custom control and Web connectivity to existing PLC and DCS-based systems

03/30/2010 | 2871
National Instruments Introduces New Low-Cost USB Device to Simplify Temperature Measurements National Instruments announced the NI USB-TC01, a USB data acquisition (DAQ) device that measures and records temperature data from a thermocouple. The new device combines a quick and easy plug-and-play setup with the high-quality capabilities and features of NI DAQ products.


Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search