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05/23/2012 | 2713
NI Expands SC Express PXI Sensor Measurement Family With New RTD Module National Instruments announced the NI PXIe-4357 RTD module, the latest addition to its SC Express sensor measurement family for PXI Express. The high-performance module is optimized for temperature measurements with Pt100 RTD sensors for a variety of thermal monitoring applications.

05/07/2012 | 2093
National Instruments Releases Wireless I/O for NI CompactRIO National Instruments announced a new wireless gateway and two new measurement nodes that extend the capabilities of the NI wireless sensor network (WSN) platform and illustrate the company’s commitment to wireless measurement technology. With NI LabVIEW system design software, engineers can easily integrate wired and wireless measurement and control systems and deploy autonomous programs to WSN nodes that perform local control, data analysis and event-based alarming or notification.

10/31/2011 | 2632
National Instruments Releases LabVIEW Toolkit for Machine Prognostics and Health Management National Instruments introduced the Watchdog Agent Prognostics Toolkit for NI LabVIEW system design software, which expands the capabilities of LabVIEW in machine prognostics and health management (PHM) applications.

09/26/2011 | 2715
National Instruments Announces NI VeriStand 2011 for Real-Time and HIL Testing The latest version of NI VeriStand configuration-based software environment now includes a real-time stimulus profile tool that greatly expands deterministic test execution with looping and branching structures, composable arithmetic functions, multitasking and more. Engineers can combine NI VeriStand 2011 with INERTIA™, an add-on from Wineman Technology, Inc, which adds a suite of tools to NI VeriStand for optimized closed-loop control of dynamometer and servo-hydraulic-based test cells.

09/02/2011 | 2882
NI Modules Expand PXI Platform Capability, Reduce Cost for Semiconductor Characterization and Test Digital per-pin parametric measurement and high-density source measure unit modules ideal for semiconductor. The NI PXIe-6556 200 MHz high-speed digital I/O with PPMU, the NI PXIe-4140 and NI PXIe-4141 four-channel SMUs reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of devices under test.

08/15/2011 | 2593
National Instruments Extends Leading PXI RF Test Performance to 14 GHz National Instruments introduced a 14 GHz version of its NI PXIe-5665 high-performance RF vector signal analyzer (VSA), which delivers best-in-class dynamic range and accuracy in a cost-effective PXI form factor.

08/11/2011 | 2537
National Instruments Expands NI CompactDAQ Platform With Single-Slot Chassis The new 1-slot NI CompactDAQ chassis support wireless, USB and Ethernet buses, giving engineers and scientists the portability of a data logger with the performance and flexibility of modular measurements.

08/08/2011 | 2469
National Instruments Announces First Multicore CompactRIO With Intel® Core™ i7 Processor and Smallest NI Single-Board RIO Devices Products expand the NI RIO Advanced Control and Monitoring Platform with higher-performance and smaller form factor targets.

07/19/2011 | 2583
NI DIAdem 2011 Expedites Analysis, Reporting of Engineering Measurement Data Latest version features include flexible load behavior for large data sets, DataPlugin Wizard for Microsoft Excel and fundamental enhancements to DIAdem REPORT.

06/28/2011 | 2590
National Instruments Digital Video Analyzer Automates Wide Range of HDMI Tests New PXI Solution delivers HDMI 1.4 protocol, emebedded audio, 3-D video measurements and real-time picture quality analysis.


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#4 December 2021
KIPiS 2021 #4
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Modern instrumentation
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