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01/30/2012 | 2309
Sequans Communications certifies the R&S CMW500 wideband radio communication tester for the alignment of its LTE chipsets Sequans Communications, a leading 4G chip maker, now uses Rohde & Schwarz test equipment to align its new generation LTE chipsets. The jointly-developed test solution is built around the multi-standard, market-leading R&S CMW500 radio communication tester.

01/26/2012 | 2948
Free technical online seminar. Understanding the Basics of Parallel Wafer Level Reliability (WLR) This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration to process reliability monitoring. The speed and accuracy of the WLR testing impact time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advanced WLR measurements.

01/16/2012 | 2842
Tektronix Adds New Comprehensive High-Speed Serial Protocol Test Platform TPI4000 Protocol analyzer series allows users to test multiple serial protocols, perform multiple functions using a single instrument.

12/28/2011 | 2294
Tektronix Wins Prestigious Elektra Award with MDO4000 Mixed Domain Oscilloscope This year On December 14 in the United Kingdom the winners of Elektra 2011 were ceremonially awarded.

12/26/2011 | 3441
Spectracom ends the year with information about some new products: STA-61 and GSG 5 Series These product lines are the basis for the continued growth and ensuring 2012 is equally successful as 2011.

12/21/2011 | 2080
Tektronix Expands, Upgrades High Voltage Probe Offerings

Industry leading bandwidth, dynamic range and input impedance characteristics target new power management technologies. Tektronix announced four new high-voltage probes and significant upgrades to three existing probe offerings. 

12/19/2011 | 2470
Anritsu Introduces In-Line Peak Power Sensor Anritsu Company introduces the MA24105A, a standalone, compact, and highly accurate in-line peak power sensor that provides a wide range of power measurement capability over a frequency range of 350 MHz to 4 GHz.

12/14/2011 | 2931
Free Technical Online Seminar. Meeting the Electrical Measurement Demands of High Power High Brightness LEDs Keithley Instruments invites to attend an online seminar which provides an overview of the electrical test equipment that is required to properly test today’s High Power High Brightness LEDs.

12/12/2011 | 2504
Tektronix MDO4000 Named Finalist for Best in Test 2012 Award World’s first mixed domain oscilloscope in running for Test & Measurement World’s Best in Test, Product of the Year Awards.

12/07/2011 | 3240
Yokogawa Enhances FA-M3V Range-free Multi-controller Yokogawa Electric Corporation announces the release on this date of enhanced CPU modules and software for the FA-M3V range-free multi-controller, a PLC with the world's fastest CPU scanning speed.


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#4 December 2021
KIPiS 2021 #4
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Modern instrumentation
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