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09/16/2011 | 2455
Agilent Technologies Provides New Level of Realism in Testing and Evaluation of Advanced Radar and Electronic-Warfare Systems Agilent Technologies Inc. (NYSE: A) announced a range of cutting-edge capabilities that enable economical testing and evaluation of advanced radar and electronic-warfare (EW) systems. Spanning signal-creation software, signal generators, measurement applications and signal analyzers, the additions enable test solutions that provide greater flexibility and cost-effectiveness than typical single-purpose EW threat simulators.

09/15/2011 | 2435
Anritsu Company Expands LTE Measurement Capabilities in Spectrum Master™ and BTS Master™ Handheld Analyzers New LTE analysis tools help field engineers and technicians install, commission, and maintain LTE networks.

09/13/2011 | 4780
Yokogawa Releases ISA100.11a-based YTMX580 Multi-input Temperature Transmitter Yokogawa Electric Corporation announces release of the YTMX580 multi-input temperature transmitter to the market. The YTMX580 is based on the ISA100.11a industrial automation wireless communication standard and features an industry-leading eight analog input channels.

09/12/2011 | 4060
Agilent Technologies Revolutionizes Oscilloscope Probing with Automatic Characterization and Correction Agilent Technologies Inc. (NYSE: A) announced PrecisionProbe software for its award-winning Infiniium 90000 X-Series and 90000A Series oscilloscopes. The software, which works in conjunction with built-in hardware in the Infiniium scopes, lets engineers automatically characterize and correct the response of any path to a scope input using no external equipment.

09/07/2011 | 2244
Agilent Technologies' New Vector Network Analyzer Delivers Enhanced Capability, Cost-Effective RF Network Analysis Agilent Technologies Inc. (NYSE: A) introduced the newest member of its popular ENA Series of network analyzers, the E5072A vector network analyzer. Available as either a two-port, 30-kHz to 4.5-GHz or 8.5-GHz instrument, the E5072A offers improved performance over current RF network analyzers, enhanced functionality, a configurable test set, and a wide output power level for full characterization of devices.

09/02/2011 | 2881
NI Modules Expand PXI Platform Capability, Reduce Cost for Semiconductor Characterization and Test Digital per-pin parametric measurement and high-density source measure unit modules ideal for semiconductor. The NI PXIe-6556 200 MHz high-speed digital I/O with PPMU, the NI PXIe-4140 and NI PXIe-4141 four-channel SMUs reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of devices under test.

08/18/2011 | 2392
Rohde & Schwarz enhances TV analyzer with drive test software that tests multiple channels and antenna options With R&S BCDRIVE, broadcast transmitter operators can now also measure network coverage with drive tests. This solution even enables them to determine network coverage in parallel for multiple broadcasting channels, which significantly reduces measurement times.

08/16/2011 | 2880
Anritsu Introduces High-Frequency Sampling Oscilloscope Probe J1512A Passive Probe for BERTWave Series allows engineers to more efficiently verify designs of high-speed digital communications equipment and devices.

08/15/2011 | 2591
National Instruments Extends Leading PXI RF Test Performance to 14 GHz National Instruments introduced a 14 GHz version of its NI PXIe-5665 high-performance RF vector signal analyzer (VSA), which delivers best-in-class dynamic range and accuracy in a cost-effective PXI form factor.

08/11/2011 | 2535
National Instruments Expands NI CompactDAQ Platform With Single-Slot Chassis The new 1-slot NI CompactDAQ chassis support wireless, USB and Ethernet buses, giving engineers and scientists the portability of a data logger with the performance and flexibility of modular measurements.


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