RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

Companies' news

RSS

07/17/2013 | 2044
Tektronix Adds Industry’s First Test Solution for New 10 Gbps SuperSpeed USB Tektronix, Inc., the world's leading manufacturer of oscilloscopes, announced a series of enhancements to its USB 3.0 test solutions including an industry first transmitter test solution for the SuperSpeedPlus 10 Gb/s specification. Other enhancements include a new USB 3.0 oscilloscope-based layered decode capability and an enhanced automated solution for SuperSpeed USB transmitter testing that improves test throughput by up to 60%.

07/15/2013 | 1955
Save the Date: NIWeek 2013 to be Held August 5-8, 2013 Join National Instruments and more than 3,200 engineers, educators, industry leaders, scientists, and students from around the world for NIWeek 2013, the 19th annual global conference on graphical system design.

07/10/2013 | 1973
Agilent Technologies Introduces FPGA Development Kit for High-Speed Digitizers Powered by Mentor Graphics The U5340A enables customers to deploy advanced real-time signal processing into the FPGAs on board Agilent high-speed digitizers. The development kit leverages the full density and speed of the FPGA while ensuring the digitizer's outstanding multi-gigasample-per-second performance.

07/08/2013 | 2162
R&S FSW signal and spectrum analyzer with new realtime option detects even short and sporadic events A new measurement option from Rohde & Schwarz for the R&S FSW high-end signal and spectrum analyzer supports realtime signal analysis for frequencies up to 50 GHz with an analysis bandwidth of 160 MHz. This makes it possible to detect interfering signals to the exact level and without gaps – all using a single, extremely fast measuring instrument with outstanding RF characteristics.

07/03/2013 | 2240
TI introduces SafeTI™ Compiler Qualification Kit to help ease functional safety development for industrial, automotive and medical products Texas Instruments Incorporated (TI) (NASDAQ: TXN) introduces its new SafeTI™ Compiler Qualification Kit. The SafeTI™ Compiler Qualification Kit assists customers in their efforts to qualify their use of the TI ARM® C/C++ compiler to functional safety standards such as IEC 61508 and ISO 26262 while helping maximize its functionality and performance. This kit, a component of the SafeTI design packages, was developed primarily for use with TI ARM Cortex-R4-based Hercules™ ARM microcontroller (MCU) platform to help make it easier for customers to develop functional safety applications.

07/02/2013 | 2369
Anritsu receive World's First PTCRB approval for its RF Conformance Test System New world-first PTCRB test case approval, Anritsu's market-leading ME7873L RF Conformance Test System expand its approved support for LTE into the LTE-Advanced test market

07/01/2013 | 1910
Agilent Technologies Introduces Industry's First Solution for Modeling Power Devices Agilent Technologies Inc. (NYSE: A) announced that its Integrated Circuits Characterization and Analysis Program (IC-CAP) software has been enhanced to provide full support for the B1505A Power Device Analyzer/Curve Tracer, including the instrument's new high-power, high-current source monitor unit modules.

06/26/2013 | 2348
Optimize Automated Test Systems With NI PXI Programmable Power Supplies National Instruments announced its newest general-purpose programmable power supplies, which offer the highest power density available in PXI and form the foundation of automated test systems.

06/24/2013 | 1946
Precise, fast, simple: Jitter analysis on clock and data signals with oscilloscopes from Rohde & Schwarz Jitter measurements are important when developing circuits with serial high-speed data interfaces such as USB 2.0 and HDMI. One particular challenge is the signal's embedded clock that is used as a time reference. Rohde & Schwarz addresses this requirement with new options for its R&S RTO high-performance oscilloscope.

06/19/2013 | 2159
Agilent Technologies Announces Analysis Software for USB Protocol Analyzers Agilent Technologies Inc. (NYSE: A) announced a new analysis software suite for the U4611A, U4611B and U4612A family of USB protocol analyzers. The suite features the new MegaZoom technology, offering USB device designers quick and easy insight into their designs' behavior, and streamlining USB test and validation.


Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search