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12/28/2010 | 2233
Emerson enhances Micro Motion® F-Series Coriolis meter with Smart Meter Verification and expanded digital communication protocols These new capabilities are enabled by connectivity to the enhanced core processor and 2400S transmitter, both powered by Micro Motion next-generation MVD™ (multivariable digital) processing technology, which enables superior stability and meter performance. The 2400S transmitter option also enables DeviceNet™ and PROFIBUS-DP protocols in an extremely compact package.

12/25/2010 | 2843
NI Measurement Studio 2010 Introduces New Support for Microsoft Visual Studio 2010 New version of software simplifies .NET test and measurement application development. Microsoft Visual Studio developers using Measurement Studio 2010 can create Windows Forms and Web Forms applications in a shorter amount of time with increased productivity tools.

12/24/2010 | 2692
Agilent Technologies Announces Signaling Conformance Test Solution for LTE User Equipment The Agilent N6070A series signaling conformance test for 3GPP LTE user equipment (UE) extends the capability of the new Agilent PXT Mobile Communications Test Set to a complete signaling conformance test solution (also known as protocol conformance test or PCT).This innovative test solution is an essential tool for LTE developers needing to verify their protocol implementation and ensure reliable performance on LTE networks.

12/22/2010 | 2749
Rohde & Schwarz takes over DVS Digital Video Systems AG Hanover-based DVS Digital Video Systems AG has been integrated into the Rohde & Schwarz group of companies. With DVS Digital Video Systems AG, Rohde & Schwarz has integrated a top technology player. DVS produces many products, including digital video systems and storage solutions for the film and TV industry.

12/21/2010 | 2294
Agilent Technologies Introduces Measurement Applications for its Low-Cost Signal Analyzer The measurement applications address cellular communications, wireless networking and digital video standards, allowing CXA, a low-cost signal analyzer, to provide a comprehensive list of measurement applications.

12/20/2010 | 2714
NI LabWindows™/CVI 2010 Improves ANSI C Developer Productivity and Simplifies FPGA Communication National Instruments announced the release of new version of NI LabWindows/CVI 2010. New version simplifies test system development for Linux, real-time and FPGA-based systems.

12/15/2010 | 2404
Agilent Technologies Introduces Next-Generation Vector Signal Analysis Software The new 89600B software provides R&D engineers performing signal and modulation analysis with a window into what's happening inside their complex wireless devices. The 89600B VSA software measures more than 70 signal standards and modulation types covering a range of applications (e.g., mobile communications, wireless connectivity, military communications, satellite communications, and more).

12/13/2010 | 2430
Keithley’s free technical online seminar on Bias Temperature Instability and State of the Art Measurement Methods Keithley Instruments invites to take part in free technical online seminar “Fundamentals of BTI Bias Temperature Instability and State of the Art Measurement Methods” on Thursday, December 16, 2010.

12/10/2010 | 2978
Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User Equipment The PXT test set is designed for RF characterization, protocol verification and end-to-end application testing of LTE user equipment (UE). This new instrument transforms LTE device verification by minimizing design uncertainty and reducing lab setup time, while maximizing performance and scalability.

12/08/2010 | 2450
Agilent Technologies Debuts PXI-Based Digital Multimeters These new 6.5 digit PXI digital multimeters (DMMs) are to complement Agilent’s growing family of PXI products. The M9182A 6.5 digit DMM and M9183A 6.5 digit enhanced-performance DMM measure common parameters such as DCV, DCI, ACV, ACI, 2- and 4-wire resistance and temperature. The M9183A is capable of additional measurements, such as capacitance.


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