RU |
Login
Newsletters
There is no newsletter category found. Information
|
Companies' news
01/30/2012 | 2308
Sequans Communications, a leading 4G chip maker, now uses Rohde & Schwarz test equipment to align its new generation LTE chipsets. The jointly-developed test solution is built around the multi-standard, market-leading R&S CMW500 radio communication tester.
01/26/2012 | 2947
This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration to process reliability monitoring. The speed and accuracy of the WLR testing impact time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advanced WLR measurements.
01/16/2012 | 2841
TPI4000 Protocol analyzer series allows users to test multiple serial protocols, perform multiple functions using a single instrument.
12/28/2011 | 2293
This year On December 14 in the United Kingdom the winners of Elektra 2011 were ceremonially awarded.
12/26/2011 | 3440
These product lines are the basis for the continued growth and ensuring 2012 is equally successful as 2011.
12/21/2011 | 2079
Industry leading bandwidth, dynamic range and input impedance characteristics target new power management technologies. Tektronix announced four new high-voltage probes and significant upgrades to three existing probe offerings.
12/19/2011 | 2467
Anritsu Company introduces the MA24105A, a standalone, compact, and highly accurate in-line peak power sensor that provides a wide range of power measurement capability over a frequency range of 350 MHz to 4 GHz.
12/14/2011 | 2930
Keithley Instruments invites to attend an online seminar which provides an overview of the electrical test equipment that is required to properly test today’s High Power High Brightness LEDs.
12/12/2011 | 2503
World’s first mixed domain oscilloscope in running for Test & Measurement World’s Best in Test, Product of the Year Awards.
12/07/2011 | 3238
Yokogawa Electric Corporation announces the release on this date of enhanced CPU modules and software for the FA-M3V range-free multi-controller, a PLC with the world's fastest CPU scanning speed.
|
Current issue
Search
|
© "Test & Measuring Instruments and Systems" ("KIPiS"), 2000-2024 |