RU
News from Anritsu(145)
News from Fluke(23)
News from Keithley(33)
News from Keysight Technologies(349)
News from Metrel(0)
News from National Instruments(145)
News from Pendulum(14)
News from Rigol(10)
News from Rohde & Schwarz(284)
News from Tektronix(157)
News from Texas Instruments(90)
News from Yokogawa(41)
Anritsu
Fluke
Keithley Instruments
Keysight Technologies
METREL
National Instruments
Pendulum Instruments
RIGOL Technologies
Rohde & Schwarz
Tektronix
Texas Instruments
Yokogawa
Login
Login:
Password:
Forgot your password?
Register
Information

Companies' news

RSS

03/12/2012 | 2068
Agilent Technologies to Demonstrate Industry-First Design and Test Solutions for 3G/4G and LTE-Advanced at Mobile World Congress Agilent Technologies Inc. will demonstrate its leading-edge communications test and measurement solutions for 3GPP LTE-Advanced, LTE,W-CDMA, HSPA+, E-EDGE (EDGE Evolution), UMA/GAN, WiMAX(tm), and femtocells at the Mobile World Congress in Barcelona, Feb. 14-17.

03/07/2012 | 2763
Tektronix Announces High-Speed Optical Testing Toolset for Ethernet Standards New optical modules for DSA8300 digital signal analyzer support optical compliance test up to 100G. This complete solution eliminates the need for additional test equipment such as optical-to-electric converters.

03/05/2012 | 3144
Spectracom Assures GPS Integrity with Leap Second Testing Tools GPS simulators offer fast and easy testing of the upcoming leap second event on June 30 to validate performance of GPS devices and systems.

02/29/2012 | 6167
What Is an SMU Instrument, and How Do You Decide Which One Is Right for Your Application? This web seminar will explain the basics of how SMU instruments work, describe key features and capabilities to consider for selecting an SMU instrument, and compare the actual performance of different SMU instruments in "real-world" applications.

02/27/2012 | 3453
New GPS Simulator for Manufacturing Test Spectracom’s GSG-52 broadens the range GPS RF signal generators. Spectracom, a company of the Orolia Group and the leading provider of practical test solutions for GPS and GNSS devices and systems, has announced a new offering in its line of GPS constellation simulators.

02/22/2012 | 2443
Tektronix MDO4000 Named ACE Awards Finalist in the Test and Measurement Systems and Boards Category World’s first mixed domain oscilloscope captures another prestigious industry award recognition.

02/20/2012 | 2136
Agilent Technologies Introduces Triple-Output Power Supplies with Front-Panel Programming that Simplifies Automation Setup Agilent Technologies Inc. introduced the U8030 Series of DC power supplies, the only triple-output power supplies in their class with front-panel programming. In benchtop or industrial settings, front-panel analog programming saves time and reduces complexity by allowing the user to set and control key output parameters-without extensive programming knowledge.

02/15/2012 | 2193
Rohde & Schwarz drive test solution now offers complete MIMO measurements in real LTE networks Network operators want to take full advantage of their new and existing resources when they upgrade to LTE. To support this objective, Rohde & Schwarz has added MIMO-specific measurements to its R&S ROMES4.65 drive test software. Using this feature, the R&S TSMW network scanner can quickly identify interferers that reduce MIMO performance in LTE networks.

02/13/2012 | 2338
Infiniium oscilloscopes of Agilent Technologies won the EDN China Innovation award Agilent Technologies announced that its Infinium 2000 and 3000 X series oscilloscopes won EDN China Innovation award 2011 for the best device in the test and measurement category.

02/01/2012 | 2268
Tektronix Adds New Capabilities to PCI Express 3.0 Test Solution Tektronix, Inc., a leading supplier of test, measurement, and monitoring products and solutions, announced new software capabilities for its TLA7SA08 and TLA7SA16 Logic Protocol Analyzer Modules supporting PCI Express (PCIe) 3.0, the next generation PCIe specification.


Current issue
#4 December 2021
KIPiS 2021 #4
Topic of the issue:
Modern instrumentation
Search