Shumskiy I.

Some time ago «NPP Eliks» ÑJSC company got the request from one of its long-term partner to supply low cost and at the same time high-performance oscilloscopes for the organization production line. Earlier the organization had used Tektronix TDS2012C oscilloscopes which fully met the customer’s requirements. But the progress always goes forward and with time there have come new oscilloscope models which have the similar or higher specifications and sometimes even lower price. Therefore the specialists of Eliks company offered several scopes of the same class and demonstrated the detailed presentations letting the customer make the right choice…

Semiconductor electrophysics of today can hardly be imagined without C-V characteristic measurement meaning the capacitance measurement as a function of the applied direct offset voltage. This very measurement allows quickly identifying the basic parameters of semiconductor and dielectric layers which direct measurement is considered a rather complicated process. You will find more details in the present article and also get to know about the use of AKTAKOM LCR analyzers for semiconductor C-V measurement.

We keep on publishing a series of articles devoted to the main principles of choosing a digital oscilloscope for your measurement tasks. In the current article we would like to draw your attention to the sampling as the main characteristic of digital oscilloscopes, namely how the mode, number of digits and sampling rate affect the measurement results.

Nowadays it’s quite common to use a digital oscilloscope jointly with other devices for complex measurements and further data processing within a measuring system. However to integrate an oscilloscope into the complex measuring system there are some other additional technical capabilities required besides data transferring to PC or the local network. The current article in a very detail demonstrates the main of such capabilities and gives you examples of oscilloscope operation within the complex systems.