Strunin P.

The article describes the expanded signal analysis capabilities based on measurements with postprocessing implemented using hardware and software options of modern digital oscilloscopes. There is also prerequisite analysis made for the development of such options, as well as their classification introduction. The present article will inform you of the whole range of practical tasks that can be solved with the options functional capabilities of R&S RTO and R&S RTP series oscilloscopes as one of the most advanced measuring instruments in the market.

The present article demonstrates the state-of-the-art capabilities of jitter analysis in high-speed digital devices by the example of R&S RTO-K12 option. The author suggests analyzing the reasons that may cause jitter, classification of its components and the main approaches to its reduction, as well as the typical consequences of this phenomenon appearance when operating digital devices. This article also demonstrates the existing methods of jitter analysis and shows examples of measurements using R&S RTO-K12 option to estimate temporal and statistical characteristics of digital signal jitter.