KIPiS articles

Author(s):  Bryanskiy L.
Issue:  KIPiS 2013 #3
Metrology, its formation and development is one of the general laws, formation signs and development of any human civilization. The present article contains detailed facts proving the close correlation between these two concepts.

Author(s):  Levin S.
Issue:  KIPiS 2013 #3, KIPiS 2013 #4
«The catastrophical phenomenon of 1985-1986» was unprecedented because of numerous waivers from the use of aviation, space, missile, nuclear power and other types of complex equipment which operation requires measuring control systems based on computers with special software installed. According to the research one of the reasons for such catastrophical phenomenon was errors of measurement, static evaluation as well as the mathematical models of the objects implemented with the calculation programs. Find more details in the article written by D.Eng., Professor Levin S.F.

Author(s):  Afonskaya, Tatiana , Afonskiy, Alexander
Issue:  KIPiS 2013 #3
The end of May is marked by the outstanding event in the metrology world — 9th Moscow International Forum «Precision Measurement — The Basis of Quality and Safety» was held on May 21-23. This year the event was remarkable for its scale: several exhibitions covered almost 6.500 square meters, more than 300 companies participated in the event and demonstrated more than 2.500 innovative devices. 5th Moscow International Symposium of metrologists «Precision. Quality. Safety» was held within this Forum. Find more details and learn what the leading metrologists and specialists consider crucial to solve the most important questions in Russian metrology.

Author(s):  Afonskaya, Tatiana , Afonskiy, Alexander
Issue:  KIPiS 2013 #3
On April 25-26 representatives of the press world had a unique opportunity to visit a press-event extremely well organized by Rohde&Schwarz. Rohde&Schwarz specialists were ready to give exclusive interviews, show informative presentations and demonstrate innovative devices of the company. Find more about this splendid event and read the interview with Roland Steffen, Head of the Test and Measurement Division, Executive Vice President of Rohde&Schwarz in the present article.

Issue:  KIPiS 2013 #3
Beginning of 2013 is marked with the introduction of many interesting innovative products in the field of test and measuring instruments. Thus Fluke Corporation and Tektronix have released several new high-performance devices. Detailed presentations were demonstrated on April 2 during the Press-event jointly organized by Fluke and Tektronix.

Author(s):  Peterson, Stephen
Issue:  KIPiS 2013 #3
This article focuses on the advantages of «smart» instrument drivers using PXI as an example.

Author(s):  Ami Teli
Issue:  KIPiS 2013 #3
Over the last decade, there has been increasing consumer demand for greater functionality in almost all the electronic products that consumers buy from smartphones to tablet computers. This has made testing the components that go into these products more challenging for these manufacturers’ suppliers and on their own production lines.

Author(s):  Afonskiy, Alexander
Issue:  KIPiS 2013 #3
In the previous issues of our magazine we described various handheld multimeters. One of the typical varieties of multimeters is RLC meters which specialize in measurement of different parameters of electric circuit elements. The following article contains the detailed description of handheld models of AKTAKOM RLC meters. The interesting fact is the update and enhancement of AKTAKOM RLC meters family. Read about new interesting capabilities and features of these devices in the present article.

Issue:  KIPiS 2013 #2
This article describes challenges of measurement in industrial applications using wireless measuring devices. The main attention is devoted to consideration of the wireless system Fluke ® CNX — the first tool for test and measurement, capable for wireless communication with multiple measurement modules.

Author(s):  Stauffer, Lee
Issue:  KIPiS 2013 #2
The recent drive toward greater energy efficiency has created an increasing demand for better high power semiconductor devices such as diodes, FETs, IGBTs and others. New technologies hold the promise of higher performance, including lower ON-state losses, lower OFF-state leakage, faster switching, and reduced loss while switching. However, along with the improved performance of these devices, characterization and measurements are becoming more complex and difficult. This article addresses a typical workflow in the design and development of a power semiconductor device, and discusses some of the equipment and measurement challenges associated with them.

Issue:  KIPiS 2013 #2
The article describes the purpose of the vector network analyzers and contains the information about features of the new VNA PXIe-5632 including the overview of the NI PXIe-5632, the mixer measurements, the intermodulation measurements, and the calibration function. The article also describes the advantages of dual-source architecture in terms of the new NI PXIe-5632.

Issue:  KIPiS 2013 #2
This article discusses the Agilent PXA’s technical innovations and the resulting benefits to those who need realtime RF signal analysis. It explains and discusses real-time analysis in concise terms and describes applications for the real-time PXA.

Author(s):  Ruiz, Rafael , Hellwig, Mathias
Issue:  KIPiS 2013 #2
This article presents the I/Q Software Interface (R&S® K11 option) of the R&S®RTO in the context of remote applications. It demonstrates the basic operation, application examples, and an analysis in MATLAB®.

Author(s):  Afonskaya, Tatiana , Kolesnikova Olga
Issue:  KIPiS 2013 #1
On January 29, 2013, within DesignCon conference Test & Measurement World announced the winners of Best in Test Award in its various categories. This award is presented annually to those competitors who have managed to develop the most important and innovative products and services in electrical and instrumentation industry. The present article names the winner of 2012, as well as the winners of the previous three years.

Author(s):  Afonskaya, Tatiana , Afonskiy, Alexander
Issue:  KIPiS 2013 #1
With more than four decades of success, every year the International Consumer Electronics Show (CES) attracts more and more exhibitors, journalists and visitors. Actually The 2013 International CES, held on January 8-11, was the largest in the event’s history, with a record number of exhibitors across the largest show floor in CES history. In the following article you can read about the most impressive booths and innovative technologies demonstrated at the show.

Issue:  KIPiS 2013 #1
Agilent Technologies announced a new real-time spectrum analyzer (RTSA). In the market general-purpose signal analyzer and real-time spectrum analyzer are two different devices. But Agilent Technologies has combined real-time analysis function with the high performance PXA X-series signal analyzer. The unique attribute of Agilent’s RTSA is that it is also an upgradable option to new and existing PXA X-series signal analyzers. Therefore there is no need to purchase a new device, instead of it an existing PXA signal analyzer bought for example several years ago can be upgraded to real-time spectrum analyzer. It can be easily made due to the unique architecture of the X-series analyzers which CPU and memory can be easily upgraded to accept the latest generation of microprocessors. Agilent’s RTSA delivers unmatched probability of intercept (POI), analysis bandwidth, sensitivity, and frequency range — capabilities that make it the best way for system developers and signal analysts to see, capture and understand highly elusive signals. It gives users greater confidence that they’ve achieved a detailed understanding of what’s happening inside a signal-rich system or environment.

Author(s):  Beck, Doug, Larsen, Kris
Issue:  KIPiS 2013 #1
Improving the user interface on oscilloscopes is no trivial task. While a previous team at Agilent was able to simplify and improve high performance oscilloscopes more than a decade ago with Infiniium, could the same thing be done for portable oscilloscopes?

Issue:  KIPiS 2012 #6
October 2012, as usual, has become famous for several huge electronics fairs in Hong Kong: China Sourcing Fair (October 12-15) and exhibitions-twins Hong Kong Electronics Fair and electronicAsia (October 13-16). From the present review of this Autumn Fairs you may get to know how fascinating these shows were and which innovations were demonstrated during the exhibitions.

Issue:  KIPiS 2012 #6
The 25th electronica, the International Trade Fair for Electronic Components, Systems and Applications, took place in Munich starting from November 13 and closed its doors on November 16 with more than 72,000 visitors. A total of 2,669 exhibitors from 49 countries presented the future of electronics and showcased application-oriented solutions during the four-day fair, which revolved around intelligent and energy efficient solutions in the sectors for energy storage, LEDs and smart grids.

Issue:  KIPiS 2012 #6
From October 16 to 19 «ITE Siberian Fair» exhibition organizer held «IDES/ Infrastructure Development of Siberia – 2012» («Sibpolytech») international industrial exhibition. During the exhibition there were lots of crucial questions raised concerning water consumption and resource-saving.