Component Testing Using an Oscilloscope with Integrated Waveform Generator

This article describes methods for testing components with an oscilloscope and signal generator. The technique is shown for the capacitors, inductors, diodes, bipolar transistors and wires testing. Furthermore, the described methods can be used to find faulty components or to determine nominal parameters of the unmarked components.
Author(s):  Weller, Dennis
Issue:  KIPiS 2011 #2